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A new tool allowing automatic generation of equivalent mdeol for passive devices is currently under development. From S parameter measurement in standard Touchstone format (.s1p and s2p), the tool can quickly compute an equivalent polynomial expression, and then extract an equivalent SPICE netlist. The figure below describes the prototype interface. The user loads a Touchstone file and defines an order range for the polynomial expression. In order to speed up the extraction, the user can set a level of simplification of the input measurement. The polynomial extraction stops when the accuracy criteria are reached. In the following example, the input impedance of a device is modelled by an equivalent polynom. The computed polynom (the blue curve) perfectly matchs with the measured impedance profile (the red curve).
In the next version of IC-EMC, an interface to perform parametric analysis will be proposed. The following figure presents a prototype of the interface. Up to 5 parameters can be configured, concerning all the devices and models instance present in a schematic.
A new tool for statistical analysis of EMC measurement (emission spectrum and susceptibility threshold) will be proposed in the next version of IC-EMC. A set of EMC measurement curves can be loaded to extract figures such as average level, measurement repeatability, dispersion between components... A EMC failure risk analysis will be also proposed. From a serie of measurements and a given emission or susceptibility limit, a EMC failure probability due to measurement error, repeatabiliy and component dispersion can be computed.
Eye diagram is a powerful tool to analyze the signal integrity degradation of a signal. In the future version of IC-EMC, a new symbol will be proposed to be placed on the schematic, allowing eye diagram plot.
Internal power and ground planes in PCB form resonant cavities that change the impedance seen between these different nodes. A tool is under development to estimate the impedance matrix between different access ports mounted on a rectangular cavity. The proposed model is fundamental to optimize decoupling capacitor choice and placement.
